Laser Diffraction Particle Size Analysis From 10 nm to 3,500 µm

The LS 13 320 XR Particle Size Analyzer combines laser diffraction and PIDS technology to deliver high-resolution results with built-in method control and pass/fail review.

LS 13 320 XR Particle Analyzer
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Cover your full particle size range with one instrument

Get a clear release decision — no manual interpretation

Spend less time on compliance documentation

Beckman Coulter particle analysis experts evaluating LS 13 320 XR results

Why Choose the LS 13 320 XR Particle Size Analyzer?

Particle size results can affect batch release, product consistency, performance and investigation timelines.

The LS 13 320 XR Particle Size Analyzer gives teams laser diffraction particle size analysis across a measurement range of 10 nm to 3,500 µm while offering clear operator workflows and pass/fail reviews. It combines laser diffraction with Polarization Intensity Differential Scattering (PIDS) to deliver high-resolution measurements.

The ADAPT Software supports pre-configured methods, automatic pass/fail checks and self-check information during sampling. These tools help operators follow defined methods and see whether results are within or outside sample specifications.

 

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Why Laboratories Choose the LS 13 320 XR for Quality Control

Close-up view of the LS 13 320 XR DPS module

Broad Measurement Range

Measure particle size distributions from 10 nm to 3,500 µm with laser diffraction and PIDS technology.

Direct Sub-Micron Particle Detection

PIDS technology supports direct detection of particles as small as 10 nm and multimodal fractions in the sub-micron range.

Pass/Fail Review for QC Specifications

ADAPT Software automatically shows whether results are within or outside defined sample specifications, giving operators a clear quality control review step.

Built for a Broad Range of Sample Matrices

Suitable for routine particle size analysis in labs working with dry powders, aqueous and non-aqueous samples.

Method Control for Routine Particle Size Measurement

Pre-configured methods support repeatable particle size analysis and reduce the number of manual decisions operators make during routine testing.

Data Integrity Support

ADAPT Software can support 21 CFR Part 11 requirements with secure user sign-on, user-level permissions, audit trail, error log files, administrative configuration tools, and electronic signature capability.

GMP Support

The LS 13 320 XR Particle Size Analyzer supports good manufacturing practice needs with tools for Installation Qualification (IQ) and Operational Qualification (OQ).

LS 13 320 XR DPS module eject

Use it to support these applications:

LS 13 320 XR DPS module sample loading

Raw material testing

In-process checks

Finished product quality control

Particle size distribution review

Specification-based pass/fail review

Method transfer between operators or sites

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Product not for use in diagnostic or therapeutic procedures.